KLA Tencor Omnimap RS75TC Wafer Test & Measurement System – 8" Wafers

KLA-Tencor Omnimap RS75TC Wafer Test & Measurement System – 8" Wafers

Used wafer test and measurement system from a semiconductor production environment. Ideal for process monitoring, R&D labs, and thin-film characterization on 8" wafers.

Key facts

Model: KLA-Tencor Omnimap RS75TC

Type: Wafer test & measurement system (resistivity / thin film mapping)

Year of manufacture: 1999

Wafer size: Up to 8" (200 mm)

USED, IN GOOD VISUAL CONDITION, NOT TESTED.

Packing and preparation for shipment available upon request.